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Residual lifetime prediction model of nonlinear accelerated degradation data with measurement error
  • ISSN号:1004-4132
  • 期刊名称:《系统工程与电子技术:英文版》
  • 时间:0
  • 分类:N945[自然科学总论—系统科学]
  • 作者机构:[1]Equipment Management & Safety Engineering College, Air Force Engineering University, Xi’an 710051, China, [2]Defense Technology Research Academy, China Aerospace Science & Industry Corporation, Beijing 100854, China
  • 相关基金:This work was supported by the National Defense Foundation of China(71601183).
中文摘要:

For the product degradation process with random effect (RE), measurement error (ME) and nonlinearity in step-stress accelerated degradation test (SSADT), the nonlinear Wiener based degradation model with RE and ME is built. An analytical approximation to the probability density function (PDF) of the product's lifetime is derived in a closed form. The process and data of SSADT are analyzed to obtain the relation model of the observed data under each accelerated stress. The likelihood function for the population-based observed data is constructed. The populationbased model parameters and its random coefficient prior values are estimated. According to the newly observed data of the target product in SSADT, an analytical approximation to the PDF of its residual lifetime (RL) is derived in accordance with its individual degradation characteristics. The parameter updating method based on Bayesian inference is applied to obtain the posterior value of random coefficient of the RL model. A numerical example by simulation is analyzed to verify the accuracy and advantage of the proposed model.

英文摘要:

For the product degradation process with random effect (RE), measurement error (ME) and nonlinearity in step-stress accelerated degradation test (SSADT), the nonlinear Wiener based degradation model with RE and ME is built. An analytical approximation to the probability density function (PDF) of the product's lifetime is derived in a closed form. The process and data of SSADT are analyzed to obtain the relation model of the observed data under each accelerated stress. The likelihood function for the population-based observed data is constructed. The population-based model parameters and its random coefficient prior values are estimated. According to the newly observed data of the target product in SSADT, an analytical approximation to the PDF of its residual lifetime (RL) is derived in accordance with its individual degradation characteristics. The parameter updating method based on Bayesian inference is applied to obtain the posterior value of random coefficient of the RL model. A numerical example by simulation is analyzed to verify the accuracy and advantage of the proposed model.

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期刊信息
  • 《系统工程与电子技术:英文版》
  • 主管单位:中国航天机电集团
  • 主办单位:中国航天工业总公司二院
  • 主编:高淑霞
  • 地址:北京海淀区永定路52号
  • 邮编:100854
  • 邮箱:jseeoffice@126.com
  • 电话:010-68388406 68386014
  • 国际标准刊号:ISSN:1004-4132
  • 国内统一刊号:ISSN:11-3018/N
  • 邮发代号:82-270
  • 获奖情况:
  • 航天系统优秀期刊奖,美国工程索引(EI)和英国科学文摘(SA)收录
  • 国内外数据库收录:
  • 荷兰文摘与引文数据库,美国工程索引,美国剑桥科学文摘,美国科学引文索引(扩展库),英国科学文摘数据库
  • 被引量:242