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Storage reliability assessment model based on competition failure of multi-components in missile
  • ISSN号:1004-4132
  • 期刊名称:《系统工程与电子技术:英文版》
  • 时间:0
  • 分类:N945[自然科学总论—系统科学]
  • 作者机构:[1]Equipment Management and Safety Engineering College, Air Force Engineering University, Xi’an 710051, China, [2]Defense Technology Research Academy of China Aerospace Science and Industry Corporation, Beijing 100854, China
  • 相关基金:This work is supported by the National Defense Foundation of China(71601183).
中文摘要:

The degradation data of multi-components in missile is derived by periodical testing. How to use these data to assess the storage reliability (SR) of the whole missile is a difficult problem in current research. An SR assessment model based on competition failure of multi-components in missile is proposed. By analyzing the missile life profile and its storage failure feature, the key components in missile are obtained and the characteristics voltage is assumed to be its key performance parameter. When the voltage testing data of key components in missile are available, a state space model (SSM) is applied to obtain the whole missile degradation state, which is defined as the missile degradation degree(DD). A Wiener process with the time-scale model (TSM) is applied to build the degradation failure model with individual variability and nonlinearity. The Weibull distribution and proportional risk model are applied to build an outburst failure model with performance degradation effect. Furthermore, a competition failure model with the correlation between degradation failure and outburst failure is proposed. A numerical example with a set of missiles in storage is analyzed to demonstrate the accuracy and superiority of the proposed model.

英文摘要:

The degradation data of multi-components in missile is derived by periodical testing. How to use these data to assess the storage reliability (SR) of the whole missile is a difficult problem in current research. An SR assessment model based on competition failure of multi-components in missile is proposed. By analyzing the missile life profile and its storage failure feature, the key components in missile are obtained and the characteristics voltage is assumed to be its key performance parameter. When the voltage testing data of key components in missile are available, a state space model (SSM) is applied to obtain the whole missile degradation state, which is defined as the missile degradation degree (DD). A Wiener process with the time-scale model (TSM) is applied to build the degradation failure model with individual variability and nonlinearity. The Weibull distribution and proportional risk model are applied to build an outburst failure model with performance degradation effect. Furthermore, a competition failure model with the correlation between degradation failure and outburst failure is proposed. A numerical example with a set of missiles in storage is analyzed to demonstrate the accuracy and superiority of the proposed model.

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期刊信息
  • 《系统工程与电子技术:英文版》
  • 主管单位:中国航天机电集团
  • 主办单位:中国航天工业总公司二院
  • 主编:高淑霞
  • 地址:北京海淀区永定路52号
  • 邮编:100854
  • 邮箱:jseeoffice@126.com
  • 电话:010-68388406 68386014
  • 国际标准刊号:ISSN:1004-4132
  • 国内统一刊号:ISSN:11-3018/N
  • 邮发代号:82-270
  • 获奖情况:
  • 航天系统优秀期刊奖,美国工程索引(EI)和英国科学文摘(SA)收录
  • 国内外数据库收录:
  • 荷兰文摘与引文数据库,美国工程索引,美国剑桥科学文摘,美国科学引文索引(扩展库),英国科学文摘数据库
  • 被引量:242