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Study on mechanism of etching in low pressure radio-frequency plasmas
ISSN号:1567-1739
期刊名称:Current Applied Physics
时间:0
页码:S121-S125
相关项目:反应离子刻蚀微观不均匀性的跨尺度研究
作者:
Dai, Zhong-Ling|Yue, Guang|Wang, You-Nian|
同期刊论文项目
反应离子刻蚀微观不均匀性的跨尺度研究
期刊论文 13
会议论文 5
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Study of Characteristics of the Radio-Frequency Sheath over a Substrate with a Circular Trench
Simulation of low-frequency power’s effects on dual frequency capacitive sheath near a concave
Study on feature profile evolution for chlorine etching of silicon in an RF biased sheath
Feature Profile Evolution During Etching of SiO2 in Radio-Frequency or Direct-Current Plasmas
Feature Profile Evolution During Etching of SiO2 in Radio-Frequency or Direct-Current Plasmas
Simulations of Ion Behaviors in a Photoresist Trench During Plasma Etching Driven by a Radio-Frequency Source
Study of Characteristics of the Radio-Frequency Sheath over a Substrate with a Circular Trench
Characteristics of a Collisional Sheath Biased by a Dual Frequency Source