中文摘要：

采用掠入射X射线衍射方法对α相均聚辛基芴（PFO）薄膜的结晶性进行了表征，并探讨了不同仪器构型对实验结果的影响。结果表明，与常规X射线衍射方法相比，掠入射X射线衍射可以消除或减小基底的干扰并增大薄膜的衍射信号，能明显地测量出α相PFO薄膜的各衍射峰。采用较大狭缝的测试系统得到的信号较大，但是仪器的宽化凶子也随之增大，通过比较发现利用Scherrer公式计算微晶尺寸时求解真实宽化因子使用公式B^2-b^2较好。

英文摘要：

Crystallization of a phase polyoctylfluorene（PFO） film was characterized by grazing incident X-ray diffraction（GIXRD）. Effect of instrument slits was also studied. Results showed that contrasting with normal X-ray diffraction, diffraction peaks could be clearly observed when background signal was eliminated and their intensities were enhanced by GIXRD. Using larger slits led to stronger diffraction intensity and more broad diffraction peak. B^2 -b^2 equation was considered to be suitable for the calculation of real FWHM used to calculate erystallites size.