将综述具有记忆效应的射频微波功放器件非线性表征、测量和行为建模的最新进展.首先通过比较连续波和脉冲射频大信号测量实例,揭示自热与电器记忆效应对射频微波功放器件性能的影响.然后介绍如何将X参数行为模型扩展到考虑了射频微波器件强非线性及长期记忆效应的动态X参数行为模型理论、实验方案和模型记忆核辨识实例.最后展望了非线性长期记忆效应测量与行为建模技术的未来发展研究方向.
In the paper, we will overview new progress on nonlinear measurement and behavioral modeling for RF Power amplifiers with memory effects. First the impact of thermal and electrical memory effects upon the perform ance of a RF power amplifiers will be revealed by comparing continuous wave and pulsed RF large-signal measure ments. Next an extension of the X-parameters behavioral model to account for hard nonlinear and long-term memory effects of RF and microwave components which is called dynamic X-parameters behavioral model will be presented. Here nonlinear behavioral model's mathematical derivations, experiment scheme and memory extraction methods are introduced. Finally, the future nonlinear measurement and behavior modeling development is also forecasted.