中文摘要：

全速电流测试是一种新的电路测试方法,以AT89C51微处理器为例,说明用全速电流测试进行微处理器测试的可能性.实验中将80C51内核的HDL描述转换为赋值判决图（ADD）,然后由ADD产生测试所需的指令序列,最后令微处理器重复执行产生的指令序列,并用普通的万用数字电流表测量微处理器消耗的平均电流.实验结果表明,用全速电流测试在指令级对AT89C51微处理器进行测试是可行的.通过测试所有的数据通路,不仅可以检测数据通路的故障,而且可以检测由于控制错误而引起的数据传送错误.

英文摘要：

At-speed current testing is a novel method to test digital circuit. An experimental research for at-speed current testing to be applied to AT89C51 microprocessor is presented, the HDL description of 80C51 core is transformed into ADD （Assignment Decision Diagram） and generated instruction sequence from ADD for testing AT89C51. To make the test process feasible, instruction sequences generated from ADD are executed repeatedly by the microprocessor and the average current consumed by AT89C51 is then measured with a simple current meter. Experimental results show that the instruction level at-speed current testing technique is feasible for and applicable to AT89C51 microprocessor testing.