中文摘要：

针对瞬态电流测试提出了一种测试产生算法。该算法利用改进FAN算法的反向蕴涵部分激活故障并将测试向量空间映射到混沌空间,采用混沌搜索来确定未确定的测试向量位。模拟实验结果表明,将这种方法用于瞬态电流测试产生是可行的。

英文摘要：

This paper proposed a new algorithm for transient current test （IDDT） generation. The algorithm used backward implication in improved FAN algorithm to activate fault and mapped test vector space to the chaotic space, adopted chaotic search to find out the suitable testing pairs. SPICE simulation experiments were done on the test vectors generated by this algorithm. The simulation results show that it is available to use chaotic search for IDDT test generation.