中文摘要：

以热压烧结法制备摩尔分数为3%的氧化钇部分稳定氧化锆（yttria partially stabilized zirconia,Y-PSZ）陶瓷,研究了不同烧结温度和保温时间对材料力学和介电性能的影响。对Y-PSZ陶瓷与电磁波作用机理作了初步探讨。结果表明：随烧结温度升高,材料抗弯强度和断裂韧性先增大后减小,其最大值分别为648.8MPa和5.8MPa·m1/2。材料力学性能的变化是材料相对密度、晶界相含量及晶粒大小等因素共同作用的结果。适当延长保温时间能够减少晶界玻璃相、提高材料强度。Y-PSZ陶瓷对于8.2～12.4GHz频率范围的电磁波无明显损耗,但在个别频率点出现干涉损耗峰。在外电场作用下,氧空位在其平衡位置震动,在8.2～12.4GHz频率范围,Y-PSZ陶瓷中无离子松弛损耗。

英文摘要：

Yttria of 3% （in mole） partially-stabilized zirconia （Y-PSZ） ceramic was prepared by the hot pressing sintering method. The effects of sintering temperature and holding time on mechanical and microwave dielectric properties of samples were studied. The basic mechanism of the action between microwaves and the Y-PSZ ceramic was analyzed. The flexural strength and fracture toughness increase and then fall with the increase of sintering temperature, and the maximum value is 648.8 MPa and 5.8 MPa·m1/2, respectively. The changes of mechanical properties were caused by both the relative density, grain boundary content and grain size of the ceramic. Longer holding time reduced the glass phase in the grain boundary and then enhanced the flexural strength of the samples. The microwave loss of the Y-PSZ ceramic could not be detected obviously between 8.2 GHz and 12.4 GHz, but interference loss peaks occur at different frequencies. Under the influence of microwaves, oxygen vacancies vibrate at equilibrium positions, and ionic relaxation loss does not exist in the Y-PSZ ceramic between 8.2 GHz and 12.4 GHz.