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Impact of rapid thermal annealing on structural and electrical properties of ZnO thin films grown at
ISSN号:0042-207X
期刊名称:Vacuum
时间:2014.5
页码:1-4
相关项目:高K栅介质/III-V族半导体界面的原位调控及性能研究
作者:
Zhang, Yuan|Lu, Hong-Liang|Geng, Yang|Sun, Qing-Qing|Ding, Shi-Jin|Zhang, David Wei|
同期刊论文项目
高K栅介质/III-V族半导体界面的原位调控及性能研究
期刊论文 18
专利 3
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