中文摘要：

在实验室原有的原子力显微镜的基础上，进行硬件改造，实现纳米材料的电流检测。改造电路以PIC单片机为核心，与其他外围电路相互配合，结合Mplab集成开发环境进行嵌入式软件开发，并进行了实验，结果证明：该系统能够实现电流检测功能，并能可靠工作。

英文摘要：

Based on atomic force microscopy（AFM）, its circuit hardware is improved in the laboratory, so AFM has current measuring function of nano-material. PIC microcontroller controls other periphery circuits in this design, Mplab integrated development environment provides an environment to develop code for embedded microcontroller. The result of experiment tells that the system has current measuring function and can work well.