为研究无机纳米掺杂对聚酰亚胺电荷输运特性的影响,测量了美国杜邦公司生产的原始聚酰亚胺薄膜(100HN型)和纳米A1203掺杂耐电晕聚酰亚胺薄膜(100CR型)电晕老化前后的电导电流特性。实验发现,电晕老化前100CR的欧姆区电流明显大于100HN的,而空间电荷限制电流区的电流则明显小于100HN的;电晕老化后,100HN陷阱载流子密度和电老化闽值都减小,而100CR的对应值均增大。分析实验结果后得知,纳米掺杂既可能增加导带热激发自由电子浓度,又可能增大聚合物中电荷陷阱的深度和密度,这2种因素对电导电流的影响效果是相反的,分别主导着低场强和高场强电导电流大小的变化。此外,电晕老化对100CR和100HN电导电流影响不同的机制还有待进一步的研究。
To investigate the effect of inorganic nanoparticles on the carrier transportation properties of polyimide (PI), the measurement on conduction current was carried out with both the original 100HN PI film and nano- Al2O3 filled corona-resisting 100CR PI film produced by DuPont Company. Experimental results showed that: before corona aging, the current in ohm region of 100CR PI film was significantly larger than that of 100HN PI film, while the space charge limited current of 100CR PI film was less than that of 100HN PI film; after corona aging, the trapped carrier density and electrical aging threshold of 100HN PI film decreased, while both increased in case of 100CR PI film. It can be deduced from above results that the introduction of nanoparticles into polyimide may increase both the thermal- released free charge carriers and trap level density and depth. The two consequences act oppositely on the conduction current and determine the conduction current in low electric field and that in high electric field respectively. In addition, corona aging affects the conduction current of 100CR PI film and 100HN PI film differently with mechanism to be investigated.