中文摘要：

利用X射线光电子能谱对PTCDA／p-Si有机／无机光电探测器中PTCDA／ITO表面和界面进行了测试分析。结果表明，茹环上的C原子的结合能为284．6eV，酸酐中的C原子的结合能为288．7eV，并存在来源于ITO膜中的氧对C原子的氧化现象，界面处C（1s）谱中较高结合能峰消失，且峰值向低结合能发生化学位移；C=O键中O原子的结合能为531．5eV，C-O-C键中的O原子的结合能为533．4eV。

英文摘要：

Xray photoelectron spectroscopy （XPS） of surface and interface of PTCDA/ITO in PTCDA/p-Si organic-onqnorganic photoelectric detector was investigated. From Cls fine spectrum we found that the binding energy of C atoms in perylene rings was 284.6 eV; and the binding energy of C atoms in acid radical was 288.7 eV; moreover, some C atoms were oxidized by O atoms from ITO. The binding energy of O atoms in C=O bonds and C-O-C bonds was 531.5 and 533.4 eV, respectively. At the interface, the peak of high binding energy in C1s spectrum disappeared, and the main peak shifted toward lower binding energy.