中文摘要：

红外探测器组件作为目标探测和成像系统的核心器件,其空间分辨能力直接影响着探测系统的成像质量。评估探测器组件空间分辨能力时,常使用调制传递函数（MTF）,而探测器组件光学串音是影响探测器组件MTF的主要因素。介绍了一套弥散斑直径为30μm的红外小光点测试系统,并用于测试不同结构红外探测器组件的线扩散函数（LSF）来评价组件的光学串音。测试结果表明：叠层电极结构侧面存在的光响应会导致LSF展宽和次峰等现象,该结果为红外探测器组件光学串音设计提供了参考。

英文摘要：

The infrared detector module is the key device of target detection and imaging system and it＇s spatial resolution directly affects imaging quality of detection system. When evaluating the spatial resolution of detector modules, researchers usually adopt modulation transfer functiofi（MTF）, which optical crosstalk is the crucial factor to impact MTF. A set of infrared micron-spot test system was introduced whose optical dispersion diameter can achieve to 30 μm in order to test the line spread functions（LSF） of detectors with different structures to acquire optical crosstalk data. The results show that the profile of overlap electric region is photosensitive, which is the main factor to cause widening LSF, secondary peak and so on. The results provide reference for optical crosstalk design of infrared detector modules.