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Thickness-dependent metal-to-insulator transition in epitaxial VO2 films
  • 期刊名称：Mater. Res. Express
  • 时间：2014.9.9
  • 页码：046402-
  • 相关项目：BiFeO3多铁薄膜表面、界面能带结构的光电子谱研究
作者： F. Chen|L. F. Wang|S. W. Jin|W. B. Wu|
同期刊论文项目
BiFeO3多铁薄膜表面、界面能带结构的光电子谱研究
期刊论文 13 会议论文 3
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