中文摘要：

The most important interface-related quantities determined by band alignment are the barrier heights for charge trans- port, given by the Fermi level position at the interface. Taking Pb（Zr, Ti）O3 （PZT） as a typical ferroelectric material and applying X-ray photoelectron spectroscopy （XPS）, we briefly review the interface formation and barrier heights at the inter- faces between PZT and electrodes made of various metals or conductive oxides. Polarization dependence of the Schottky barrier height at a ferroelectric/electrode interface is also directly observed using XPS.

英文摘要：

The most important interface-related quantities determined by band alignment are the barrier heights for charge trans- port, given by the Fermi level position at the interface. Taking Pb（Zr, Ti）O3 （PZT） as a typical ferroelectric material and applying X-ray photoelectron spectroscopy （XPS）, we briefly review the interface formation and barrier heights at the inter- faces between PZT and electrodes made of various metals or conductive oxides. Polarization dependence of the Schottky barrier height at a ferroelectric/electrode interface is also directly observed using XPS.