利用硅烷偶联剂KH-570(γ-甲基丙烯酰氧基甲氧基硅烷)水解缩合生成的多面低聚倍半硅氧烷(POSS)溶胶为模板剂,经热解制备低介电多孔薄膜材料.使用FTIR对材料制备过程及形成机制进行动态研究,通过^29Si NMR、椭偏仪、氮气吸脱附曲线和TEM等对材料的介电性质、孔洞大小和分布情况进行表征.制备的介电多孔薄膜材料孔洞分布均匀、孔径约1nm,比表面积为384.1m^2/g,介电常数为2.5的低.
POSS sol-gel as the. porous silica template was prepared by hydrolyzation and condensation of KH- 570(γ-methacryloxypropyhrimethoxy silane). Porous film with a low dielectric constant was obtained by calcination of POSS template. The process and mechanism of film formation were investigated by I;TIR and its structure was characterized by ^29Si NMR. Ellipsometr, N2 adsorption-desorption and TEM. The results show that the film possesses uniform pore with about 1 nm size, dielectric constant 2. 5, and Sbet=384. 1 m^2/g and the effects of the surface modification reagent and it's caneentration on the dielectric property of film were discussed.