位置：成果数据库 > 会议 > 会议详情页
On Error Modeling and Analysis of Approximate Adders
  • 所属机构名称：复旦大学
  • 会议名称：IEEE/ACM International Conference on Computer Aided Design (ICCAD2014)
  • 时间：2014.11.2
  • 成果类型：会议
  • 相关项目：纳米尺度超大规模集成电路分析和优化设计研究
作者： Li Li, Hai Zhou|
同会议论文项目
纳米尺度超大规模集成电路分析和优化设计研究
期刊论文 10 会议论文 9
同项目会议论文
Efficient Bit Error Rate Estimation for High-Speed Link by Bayesian Model Fusion
Layout Decomposition with Pairwise Coloring for Multiple Patterning Lithography
SIPredict: Efficient Post-layout Waveform Prediction via System Identification
Recovery-Based Resilient Latency-Insensitive Systems
BMF-BD: Bayesian Model Fusion on Bernoulli Distribution for Efficient Yield Estimation of Integrated
Layout decomposition co-optimization for hybrid e-beam and multiple patterning lithography
Synthesis of Resilient Circuits from Guarded Atomic Actions
Structural Transformation for Best-Possible Obfuscation of Sequential Circuits