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Layout Decomposition with Pairwise Coloring for Multiple Patterning Lithography
  • 所属机构名称：复旦大学
  • 会议名称：IEEE/ACM International Conference on Computer Aided Design
  • 时间：2013.11.10
  • 成果类型：会议
  • 相关项目：纳米尺度超大规模集成电路分析和优化设计研究
作者： Ye Zhang|Wai-Shing Luk|Hai Zhou|Changhao Yan|Xuan Zeng|
同会议论文项目
纳米尺度超大规模集成电路分析和优化设计研究
期刊论文 10 会议论文 9
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