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Layout Decomposition with Pairwise Coloring for Multiple Patterning Lithography
  • 所属机构名称：复旦大学
  • 会议名称：IEEE/ACM International Conference on Computer Aided Design (ICCAD2013)
  • 时间：2013.11.10
  • 成果类型：会议
  • 相关项目：成品率驱动的纳米尺度集成电路设计方法学研究
同会议论文项目
成品率驱动的纳米尺度集成电路设计方法学研究
期刊论文 30 会议论文 16 获奖 4
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