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On the Origin of Failure Mechanism of Endurance and Retention of HfO2 based ECM Cells
  • 所属机构名称：中国科学院微电子研究所
  • 会议名称：International Conferences on Modern Materials & Technologies (CIMTEC)
  • 时间：2014
  • 成果类型：会议
  • 相关项目：阻变存储器数据保持特性失效机理研究
作者： Lv, Hangbing|Xu, Xiaoxin|Liu, Hongtao|Liu, Ming|
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