采用磁控溅射方法,在不同的溅射气压(Ar气0.5-3.0Pa)条件下沉积纯金属Fe到Si(100)衬底上,通过真空退火炉在800℃对样品进行保温2h,直接形成了正交的β-FeSi2薄膜,利用X射线衍射(XRD)、扫描电镜(SEM)、椭偏光谱仪,对不同溅射气压下合成的β-FeSi2薄膜的结晶特性、表面形貌及光学性能进行表征,研究了不同溅射气压对制备β-FeSi2薄膜的影响。结果表明:在1.5Pa时能形成较好的β-FeSi2薄膜,临界溅射气压在2.0Pa附近,当溅射气压低与临界值时,β-FeSi2薄膜的成核密度较高,且成核密度随溅射气压的增大而降低;当溅射气压超过临界值以后,β-FeSi2薄膜的成核密度基本不变;薄膜的折射率n随压强的增大而增大,消光系数k随压强的增大而减小。
In this paper using the magnetron sputtering method, the Fe tilms were deposited on Si(100) at didderent sputtering pressures (Ar 0.5-3.0Pa) , by then annealed at 800℃ for 2 h.The influence of sputtering pressure on the crystallinity and optical properties was studied by X-ray diffraction (XRD), scanning electron microscope (SEM) and spectroscopic ellipsometry. The result show that the best β-FeSi2 films can be grown at 1.5Pa. The critical sputtering pressure is 2.0Pa ,when the sputtering pressure up to the critical sputtering pressure the density of β-FeSi2 grains is high grains and decline with the increasing of sputtering pressure. When the sputtering pressure exceeds the critical sputtering pressure the density of β-FeSi2 grains is roughtly a constant;the refractive index increas and the extinction coefficient diereas with the sputtering pressure of the increasing.