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Synergistic Effect of Ionization and Displacement Damage in NPN Transistors Caused by Protons With V
  • ISSN号：0018-9499
  • 期刊名称：IEEE Transactions on Nuclear Science
  • 时间：2015.6
  • 页码：1375-1382
  • 相关项目：双极晶体管电离和位移协同效应特征及机理研究
作者： Li, Xingji|Liu, Chaoming|Yang, Jianqun|
同期刊论文项目
双极晶体管电离和位移协同效应特征及机理研究
期刊论文 24
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