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Determination of trace elements in high purity nickel by high resolution inductively coupled plasma mass spectrometry

ISSN号：1673-9108
期刊名称：《环境工程学报》
时间：0
分类：O657.63[理学—分析化学;理学—化学] P457.6[天文地球—大气科学及气象学]
作者机构：[1]School of Chemistry and Chemical Engineering, Central South University, Changsha 410083, China, [2]Department of Material and Chemical Engineering, Hunan Institute of Technology, Hengyang 421002, China, [3]College of Chemistry and Chemical Engineering, Yangtze Normal University, Fuling 408100, China
相关基金：Project（21075138） supported by the National Natural Science Fotmdation of China; Project（cstc2011jjA0780） supported by Natural Science Foundation of Chongqing City, China; Project（KJ 121311 ） supported by Educational Commission of Chongqing City of China

关键词：电感耦合等离子体质谱法, 高分辨率模式, 痕量元素, 高纯镍, 镍测定, ICP-MS, 最佳工艺条件, 相对标准偏差, high resolution inductively coupled plasma mass spectrometry, high purity nickel, trace element, matrix effect, internal standard

中文摘要：

The contents of Mg,Al,Si,Ti,Cr,Mn,Fe,Co,Cu,Ga,As,Se,Cd,Sb,Pb and Bi in high purity nickel were determined by high resolution inductively coupled plasma mass spectrometry(HR-ICP-MS).The sample was dissolved in HNO3 and HCl by microwave digestion.Most of the spectral interferences could be avoided by measuring in the high resolution mode.The matrix effects because of the presence of excess HCl and nickel were evaluated.Correction for matrix effects was made using Sc,Rh and Tl as internal standards.The optimum conditions for the determination were tested and discussed.The detection limits range from 0.012 to 1.76 μg/g depending on the type of elements.The applicability of the proposed method is also validated by the analysis of high purity nickel reference material(NIST SRM 671).The relative standard deviation(RSD) is less than 3.3%.Results for determination of trace elements in high purity nickel were presented.

英文摘要：

The contents ofMg, Al, Si, Ti, Cr, Mn, Fe, Co, Cu, Ga, As, Se, Cd, Sb, Pb and Bi in high purity nickel were determined by high resolution inductively coupled plasma mass spectrometry （HR-ICP-MS）. The sample was dissolved in HNO3 and HCI by microwave digestion. Most of the spectral interferences could be avoided by measuring in the high resolution mode. The matrix effects because of the presence of excess HC1 and nickel were evaluated. Correction for matrix effects was made using Sc, Rh and T1 as internal standards. The optimum conditions for the determination were tested and discussed. The detection limits range from 0.012 to 1.76 ~tg/g depending on the type of elements. The applicability of the proposed method is also validated by the analysis of high purity nickel reference material （NIST SRM 671）. The relative standard deviation （RSD） is less than 3.3%. Results for determination of trace elements in high purity nickel were presented.

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