利用电子束光刻和各向异性湿法腐蚀技术,在(100)SOI衬底上成功地制备出晶面依赖的硅纳米结构.这项技术利用了硅的不同晶面在碱性腐蚀溶液中具有不同腐蚀速率的特性.纳米结构脊部宽度的最小尺寸可以达到10nm以下.扫描电镜和原子力显微镜的观察表明,利用这种方法制备出来的纳米结构具有很好的重复性,而且表面光滑.
Silicon crystal-facet-dependent nanostructures have been successfully fabricated on a (100)-oriented silicon-oninsulator wafer using electron-beam lithography and the silicon anisotropic wet etching technique. This technique takes advantage of the large difference in etching properties for different crystallographic planes in alkaline solution. The minimum size of the trapezoidal top for those Si nanostructures can be reduced to less than 10nm. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) observations indicate that the etched nanostructures have controllable shapes and smooth surfaces.