欢迎您!
东篱公司
退出
申报数据库
申报指南
立项数据库
成果数据库
期刊论文
会议论文
著 作
专 利
项目获奖数据库
位置:
成果数据库
>
期刊
> 期刊详情页
Low turnoff loss reverse-conducting IGBT with double n-p-n electron extraction paths
ISSN号:0013-5194
期刊名称:Electronics Letters
时间:2012.4.4
页码:457-458
相关项目:高速高压IGBT瞬态抽出模型与新结构
作者:
H.Jiang|B.Zhang|W.Chen|M.Qiao|Z.Li|C.Liu|Z.Rao|
同期刊论文项目
高速高压IGBT瞬态抽出模型与新结构
期刊论文 12
会议论文 7
专利 15
同项目期刊论文
A new Short-Anoded IGBT with high emission efficiency
300-V High-Side Thin-Layer-SOI Field pLDMOS With Multiple Field Plates Based on Field Implant Techno
Beakdown voltage model and structure realization of a thin silicon layer with linear variable doping
A novel lateral IGBT with a controlled anode for on-off-state loss trade-off improvement
A snapback suppressed reverse-conducting IGBT with soft reverse recovery characteristic
Enhancing the robustness of the equipotential ring of edge termination for 4.5KV IGBT by introducing
Small-sized silicon-on-insulator lateral insulated gate bipolar transistor for larger forward bias s
A dual-gate and dielectric-inserted lateral trench insulated gate bipolar transistor on a silicon-on
High performance CSTBT with p-type buried layer
ESD performance of LDMOS with source-bulk layout structure optimization
A novel high voltage LIGBT with an n-region in p-substrate