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Influence of band bending and polarization on the valence band offset measured by x-ray photoelectro
  • ISSN号：0021-8979
  • 期刊名称：Journal of Applied Physics
  • 时间：0
  • 页码：4279-4282
  • 语言：英文
  • 相关项目：生长温度周期调制的MOCVD法制备p型ZnO薄膜研究
作者： Xu, Xiaoqing|Yang, Shaoyan|Wei, Hongyuan|Liu, Xianglin|Song, Huaping|Guo, Yan|Zhu, Qinsheng|Wang, Zhanguo|Wang, Jun|
同期刊论文项目
生长温度周期调制的MOCVD法制备p型ZnO薄膜研究
期刊论文 19 专利 8
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