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Thickness effect of a thin film on the stress field due to the eigenstrain of an ellipsoidal inclusi
  • ISSN号：0020-7683 %/ Elsevier Ltd
  • 期刊名称：International Journal of Solids and Structures
  • 时间：0
  • 页码：322-330
  • 语言：英文
  • 相关项目：微纳电子材料及器件的力、电、热耦合破坏理论和实验研究
作者： Liu Yulan|Wang B|Liang Xinghua|
同期刊论文项目
微纳电子材料及器件的力、电、热耦合破坏理论和实验研究
期刊论文 42 会议论文 2
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