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Microscopic mechanism of leakage currents in silica junctions
  • 期刊名称：Japanese Journal of Applied Physics
  • 时间：0
  • 页码：14-19
  • 语言：英文
  • 相关项目：微纳电子材料及器件的力、电、热耦合破坏理论和实验研究
作者： Zheng Yue|Luo Xin|Wang B|
同期刊论文项目
微纳电子材料及器件的力、电、热耦合破坏理论和实验研究
期刊论文 42 会议论文 2
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