位置：成果数据库 > 期刊 > 期刊详情页
An improved Wiener deconvolution filter for high-resolution electron microscopy images (vol 50, pg 1
  • ISSN号：0968-4328
  • 期刊名称：Micron
  • 时间：2013.10
  • 页码：67-67
  • 相关项目：利用高分辨电子显微像分析晶体势场与原子列厚度的研究
作者： Lin, Fang|Jin, Chuanhong|
同期刊论文项目
利用高分辨电子显微像分析晶体势场与原子列厚度的研究
期刊论文 21
同项目期刊论文
Revealing the elemental-specific growth dynamics of Pt–Cu multipods by scanning transmission electro
用数字全息层析成像技术测量毛细管的内径及壁厚
Digital holographic microtomography for geometric parameter measurement of optical fiber
利用单幅变形光栅条纹图提取相位的方法研究
Control of the stability and soliton formation of dipole moments in a nonlinear plasmonic finite nan
Discrete Solitons in Waveguide Arrays with Long-Range Linearly Coupled Effect
In situ Study of Oxidative Etching of Palladium Nanocrystals by Liquid Cell Electron Microscopy
Growth of Large-Area 2D MoS2(l_,)Se2, Semiconductor
Symmetry Breaking of Discrete Solitons in Two-Component Waveguide Arrays with Long-Range Linearly Co
In situ study of oxidative etching of palladium nanocrystals by liquid cell electron microscopy.
Atomic process of oxidative etching in monolayer molybdenum disulfide
Direct identification of monolayer rhenium diselenide by an individual diffraction pattern