Boron-doped silicon film as a recombination layer in the tunnel junction of a tandem solar cell
- ISSN号:1674-4926
- 期刊名称:《半导体学报:英文版》
- 时间:0
- 分类:TN304.12[电子电信—物理电子学] O511[理学—低温物理;理学—物理]
- 作者机构:[1]Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
- 相关基金:Project supported by the State Key Development Program for Basic Research of China (No. 2006CB202604), the National Natural Science Foundation of China (No. 60576036), and the National High Technology Research and Development Program of China (No. 2006AA05Z405).Acknowledgement The authors wish to acknowledge Professor Guanglin Kong for helpful discussions.
关键词:
硅薄膜, 隧道结, 等离子体增强化学气相沉积, 太阳能电池, 重组, 串联, 掺硼, 原子力显微镜, PECVD, boron-doping, tunnel junction, recombination rate, rectification
中文摘要:
Corresponding author. Email: shimingji06@semi.ac.cn