分析了ITO及CF玻璃基板表面污染的主要类型为有机物污渍和灰尘颗粒,污染主要来源于产品制作、包装、转运过程。利用正交试验设计法找出影响清洗效果的主要因素是清洗液浓度和超声清洗条件,并确定最优因素水平组合。优化后工艺条件应用于生产实践,测得接触角小于5°,灰尘粒子数平均少于6个;使线间隙≥8.0μm的CSTN—LCD产品生产良品率提高2.85%。
The varieties of stain caused by greasy filth and the particle, on the ITO&CF substrate surface were analyzed. The stain was caused in the process of manufacture, packing and delivery. The key factors, consistency of lotion and ultrasonic cleaning condition, and optimization techniques combination about improving the clean surface were found by means of orthogonal experiment design. With the optimization techniques, the contact angle less than 5°, and the average particle no more than 6 were obtained; The yield of CSTN-LCD with gap over 8.0 μm was improved by 2.85 %.