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Soft error rate analysis for combinational logic using an accurate electrical masking model
  • ISSN号：1545-5971
  • 期刊名称：IEEE Transactions on Dependable and Secure Computi
  • 时间：0
  • 页码：137-146
  • 相关项目：三维多核片上系统的体系结构和设计研究
作者： Wang, Feng1|Xie, Yuan2|
同期刊论文项目
三维多核片上系统的体系结构和设计研究
期刊论文 32 会议论文 64
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