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Spectrum analysis of 2D plasmon in GaN-based high electron mobility transistors
ISSN号:1077-260X
期刊名称:IEEE Journal of Selected Topics in Quantum Electro
时间:2013.1.1
页码:-
相关项目:新型高K栅介质双沟道AlN/GaN/AlGaN/GaN基MOS-HEMTs极化和电流坍塌效应研究
作者:
Lin Wang|Xiao-Shuang Chen|Wei-Da Hu|Wei Lu|
同期刊论文项目
新型高K栅介质双沟道AlN/GaN/AlGaN/GaN基MOS-HEMTs极化和电流坍塌效应研究
期刊论文 14
会议论文 1
专利 1
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