The irradiation damage in nickel-base alloy C-276 irradiated with 115 keV Ar ions from low to very high doses was investigated. Structural characterization was performed using transmission electron microscopy (TEM), grazing incident X-ray diffraction (GIXRD) and atomic force microscopy (AFM). High density of interstitial type dislocation loops could be observed at a dose level of around 2.75 displacements per atom (dpa). With the irradiation dose increased to 27.5 dpa, the average size of loops increased from 5 nm to 16 nm, while the density of the loops decreased from 1.4 × 1011 /cm2 to 4.6 × 10-10 /cm2 . When the irradiation dose reached 82.5 dpa, original grains were transformed into subgrains whose sizes observed from TEM were about 20~60 nm. The fragmentation of grains was confirmed by GIXRD. The mean subgrain size was 40 nm, which was obtained from the full width at half maximum (FWHM) of the X-ray diffraction lines using the Scherrer formula and Williamson formula. AFM micrographs showed that nanometer-sized hillocks formed at the dose of 82.5 dpa, which provided further evidence of grain fragmentation at a high irradiation dose.
The irradiation damage in nickel-base alloy C-276 irradiated with 115 keV Ar ions from low to very high doses was investigated. Structural characterization was performed using transmission electron microscopy (TEM), grazing incident X-ray diffraction (GIXRD) and atomic force microscopy (AFM). High density of interstitial type dislocation loops could be observed at a dose level of around 2.75 displacements per atom (dpa). With the irradiation dose increased to 27.5 dpa, the average size of loops increased from 5 nm to 16 nm, while the density of the loops decreased from 1.4 × 1011/cm2 to 4.6 × 1010/cm2. When the irradiation dose reached 82.5 dpa, original grains were transformed into subgrains whose sizes observed from TEM were about 20-60 nm. The fragmentation of grains was confirmed by GIXRD. The mean subgrain size was 40 nm, which was obtained from the full width at half maximum (FWHM) of the X-ray diffraction lines using the Scherrer formula and Williamson formula. AFM micrographs showed that nanometer-sized hillocks formed at the dose of 82.5 dpa, which provided further evidence of grain fragmentation at a high irradiation dose.