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Simulation of gas phase reactions for microcrystalline silicon films fabricated by PECVD
  • 期刊名称:Optoelectronics Letters
  • 时间:2011
  • 页码:0198-0201
  • 分类:O484.1[理学—固体物理;理学—物理] TN304.055[电子电信—物理电子学]
  • 作者机构:[1]Key Laboratory of Materials Physics,Education Ministry of China,College of Physics and Engineering,Zhengzhou University,Zhengzhou 450052,China
  • 相关基金:supported by the State Key Development Program for Basic Research of China (No.2006CB202601); the National Natural Science Foundation of China (No.51007082); the Natural Science Foundation of Henan Province (No.072300410080)
  • 相关项目:甚高频高速沉积微晶硅薄膜生长特性的研究
中文摘要:

我们在场为 hydrogenated 的一个数字煤气的阶段反应模型微晶质的硅(c-Si : H ) 从有血浆的 SiH4 和 H2 气体混合物的电影提高了化学蒸汽免职(PECVD ) 。在典型 c-Si 下面: H 免职条件,在血浆的种类的集中被计算并且 silane 部分的效果(SF=[SiH4 ]/[H2+SiH4 ]) 被调查。结果证明 SiH3 是为 c-Si 的关键先锋: H 电影生长,和另外的中立激进分子例如 Si2H5, Si2H4 和 SiH2,可以在电影免职起一些作用。与增加的 silane 部分,先锋集中增加,但是 H 原子集中很快减少,它导致更低的 H/SiH3 比率。

英文摘要:

We present a numerical gas phase reaction model for hydrogenated microcrystalline silicon(μc-Si:H) films from SiH4 and H2 gas mixtures with plasma enhanced chemical vapor deposition(PECVD).Under the typical μc-Si:H deposition conditions,the concentrations of the species in the plasma are calculated and the effects of silane fraction(SF=[SiH4]/[H2+SiH4]) are investigated.The results show that SiH3 is the key precursor for μc-Si:H films growth,and other neutral radicals,such as Si2H5,Si2H4 and SiH2,may play some roles in the film deposition.With the silane fraction increasing,the precursor concentration increases,but H atom concentration decreases rapidly,which results in the lower H/SiH3 ratio.

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