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MOS capacitance properties of silicon-based PZT thin films
  • 期刊名称：Proceedings of SPIE
  • 时间：0
  • 页码：1-4
  • 语言：中文
  • 相关项目：铁电薄膜红外光限制效应及红外应用研究
作者： Guo Ming|Shi Meirong|Zhang Xiuhua|Deng Hongmei|Qin Sumei|Yang Pingxiong|
同期刊论文项目
铁电薄膜红外光限制效应及红外应用研究
期刊论文 27
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