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Sensitive analysis of EMI effect in the μa741 operational amplifier circuit
  • 所属机构名称：工业和信息化部电子第五研究所
  • 会议名称：2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, QR
  • 时间：2013
  • 成果类型：会议
  • 相关项目：双极型器件的低剂量率辐射损伤机理与加速试验研究
同会议论文项目
双极型器件的低剂量率辐射损伤机理与加速试验研究
期刊论文 16 会议论文 19
同项目会议论文
Total dose irradiation effects in the μa741 operational amplifier with different biases
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Bias dependence of dose rate effects in the irradiated substrate PNP transistors
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Total dose irradiation effects in the μa741 operational amplifier with different biases
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Transient Current Pulse Effects of Bipolar Voltage Comparator
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Experiment and numerical simulation of total dose effects in the substrate PNP transistors
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Ionizing radiation induced leakage current in the PD-SOI devices with different layout structures
Experiment and numerical simulation of total dose effects in the substrate PNP transistors