利用偏振干涉成像光谱仪进行偏振探测,这一方法将偏振测量与干涉成像光谱技术相结合,一方面能提供辐射测量所不能提供的物体偏振信息,另一方面又可获取目标的空间图像和光谱,具有比辐射测量更高的准确度.在简要分析了利用偏振干涉成像光谱仪进行偏振检测的理论基础上,深入研究了偏振检测的方法,分析比较了目前常用的偏振探测角度(45°,60°)对偏振度探测的影响.进一步计算推导出偏振测量的最优探测角度,将之与以往常用的探测角度进行了分析比较,证明了此最佳探测角度可以有效地减小偏振误差、提高偏振探测的精度.这将极大地提高偏振干涉成像光谱仪的应用范围,为新型偏振干涉成像光谱技术的研究以及仪器研制提供重要的理论依据.
The method of measuring the intensity and state of polarization of optical radiation using polarization interference imaging spectrometer(PIIS)combines the basic theories of polarization interference imaging spectroscopy and polarization measurement technology.In this way,the PIIS can be used to detect not only the interference characteristics but also the polarization parameters.Based on the study of polarization measurement,this paper compares the effect of the degree of polarization errors for the conventional detection angles of 45°and 60°.The optimization of detection angle is then discussed,which will lead to a better angle choice for polarization measurements that enables the interference imaging spectrometers to be adapted to almost every field in which the spectroscopy has ventured and able to some where field which has not touched before.