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Effect of nickel contamination on grain boundary states at a direct silicon bonded (110)/(100) inter
Modulation of 1.5 um dislocation-related luminescence emitted from a direct silicon bonded interface
Effect of iron contamination on grain boundary states at a direct silicon bonded (110)/(100) interfa
Suppression of boron-oxygen defects in p-type Czochralski silicon by germanium doping (vol 97, 05190
Phosphorus gettering of precipitated Cu in single crystalline silicon based on rapid thermal process
Effect of germanium on the kinetics of boron-oxygen defect generation and dissociation in Czochralsk
Low-cost solar grade silicon purification process with Al-Si system using a powder metallurgy techni
Quantification of characteristic parameters for the dissociation kinetics of iron-boron pairs in Czo
Hydrogen passivation of Fe-related deep energy levels at a direct silicon-bonded (110)/(100) grain b
Formation of shallow junctions in gallium and phosphorus compensated silicon for cell performance im
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