中文摘要：

低频率(在 100 kHz 下面，甚至击倒到几百 Hz ) 近地的扫描探查声学的显微镜学(垃圾) 成功地基于商业原子力量显微镜被开发，提供一个表面下的深度侧面信息并且象 nanoscale 一样空间分辨率直到几 nm。垃圾成功地局部地习惯于图象铁电体材料的域配置和另外的 materials.Ferroelectric 域结构的表面下的结构和埋葬的结构被扫描探查清楚地设想声学的显微镜学。声学的成像起源在 SPAM 尖端下面以在激动的声学的波浪和本地结构之间的相互作用被讨论。这被期望扫描探查在材料无疑充实我们在 submicro- 理解铁电性和弹性的性质的到铁电体和其它的申请的声学的显微镜学，甚至纳米规模。

英文摘要：

Low-frequency （below 100 kHz, even down to several hundred Hz） near-field scan- ning probe acoustic microscopy （SPAM） was successfully developed based on the commer- cial atomic force microscope, providing a subsurface depth profile information and as well as nanoscale spatial resolution up to several nm. SPAM was successfully used to image locally domain configurations of ferroelectric materials and subsurface structures of other materials. Ferroelectric domain structures and the buried structures were clearly visualized by scanning probe acoustic microscopy. The acoustic imaging origin is discussed in terms of interaction between the excited acoustic wave and local structures beneath the SPAM tip. It is expected that the scanning probe acoustic microscopy in application to ferroelectrics and other materials undoubtedly enrich our understanding the nature of ferroelectricity and elasticity at submicro-, even nano-meter scale.