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Thickness Dependence of the Optical Constants of Oxidized Copper Thin Films Based on Ellipsometry an
  • 期刊名称：Chin. Phys. B (in press)
  • 时间：0
  • 页码：-
  • 相关项目：金属和半导体纳米结构表面定量分析方法研究
作者： J.B. Gong|W.L. Dong|R.C. Dai|Z.P. Wang|Z.M. Zhang|Z.J. Ding|
同期刊论文项目
金属和半导体纳米结构表面定量分析方法研究
期刊论文 47 会议论文 4
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