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Monte Carlo simulation of secondary electron images for real sample structures in scanning electron
  • ISSN号：0161-0457
  • 期刊名称：Scanning
  • 时间：2012.6.6
  • 页码：145-150
  • 相关项目：金属和半导体纳米结构表面定量分析方法研究
作者： Zhang, P.|Wang, H. Y.|Li, Y. G.|Mao, S. F.|Ding, Z. J.|
同期刊论文项目
金属和半导体纳米结构表面定量分析方法研究
期刊论文 47 会议论文 4
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