位置：成果数据库 > 期刊 > 期刊详情页
A New Analytical Method in Surface Electron Spectroscopy: Reverse Monte Carlo Method
  • 期刊名称：e-J. Surf. Sci. Nanotech.
  • 时间：2012
  • 页码：441-446
  • 相关项目：金属和半导体纳米结构表面定量分析方法研究
作者： B. Da|S.F. Mao|Y. Sun|Z.J. Ding|
同期刊论文项目
金属和半导体纳米结构表面定量分析方法研究
期刊论文 47 会议论文 4
同项目期刊论文
Atomistic cluster alignment method for local order mining in liquids and glasses
Influence of surface roughness on elastically backscattered electrons
Monte Carlo Simulation of CD-SEM Images for Linewidth and Critical Dimension Metrology
Calculation of the Emission Depth Distribution Function for Electrons Emitted from a Crystal by the
Pressure Dependence of Mn(2+) Fluorescence in MnS/ZnS Core-Shell Quantum Dots
Fluctuation between icosahedral and body-centered-cube short-range orders in undercooled Zr liquid
Validity of the semi-classical approach for calculation of the surface excitation parameter
Medium-range icosahedral order in quasicrystal-forming Zr(2)Pd binary metallic glass
Competition between fcc and icosahedral short-range orders in pure and samarium-doped liquid aluminu
Monte Carlo Simulation of X-Ray Photoemission Electron Microscopic Image for Ag/Si Nano-Structure
Study of hierarchical microstructures self-assembled by pi-shaped ABC block copolymers in dilute sol
梭型CaMoO_4:Eu~(3+)红色荧光粉的高压拉曼和荧光光谱研究
Solving extra-high-order Rubik's Cube problem by a dynamic simulated annealing
Monte Carlo simulation of secondary electron images for real sample structures in scanning electron
A Monte Carlo study of the spin polarization of secondary electrons
Systematic calculation of the surface excitation parameters for 22 materials
Method for a quick estimation of energy dependent reflection electron energy loss spectroscopy spect
Surface Optical Properties for Copper Based on Surface Kramers-Kroning Analysis
Monte Carlo Simulation of Realistic Beam-Sample Interaction in SEM: Application to Evaluation of Sha
Monte Carlo Simulation of X-ray Photoemission Electron Microscopic Image
Formation of Hexagonal Pattern of Ferrofluid in Magnetic Field
Thickness Dependence of the Optical Constants of Oxidized Copper Thin Films Based on Ellipsometry an
Pressure and Temperature Dependent Up-Conversion Properties of Yb3+-Er3+ Co-Doped BaBi4Ti4O15 Ferroe
White Light Emission of Eu3+/Ag co-doped Y2Si2O7
Structural Transition of VO2 (A) Nanorods Studied by Vibrational Spectroscopy
Upconversion Luminescence of NaYF4:Yb,Er Nanocrystals with High Uniformity
A reverse Monte Carlo method for deriving optical constants of solids from reflection electron energ
Charging Effect in Plasma Etching Mask of Hole Array
Spatially Resolved Distribution Function and the Medium-Range Order in Metallic Liquid and Glass
Photoluminescence and Raman spectroscopy studies of Eu3+-doped rutile TiO2 nanocrystals at high pres
Monte Carlo modeling of surface excitation in reflection electron energy loss spectroscopy spectrum
Structure of Cu64.5Zr35.5 Metallic Glass by Reverse Monte Carlo Simulations
Raman studies of selenium nanowires under high pressure
Luminescent properties of tris(2,2 ';-bipyridine) dichloro ruthenium(II) hexahydrate under high
Electronic structure and transport of a carbon chain between graphene nanoribbon leads
Monte Carlo Study of the Influence of Electron Beam Focusing to SEM Linewidth Measurement
Electronic transport in large systems through a QUAMBO-NEGF approach: Application to atomic carbon c
Thickness dependence of the optical constants of oxidized copper thin films based on ellipsometry and transmittance