利用脉冲激光沉积技术(PLD),在不同的制备工艺条件下,分别在Pt/Ti/Si02/Si基片上制备了Bi0.5Na0.5TiO3(BNT)系列的Bi0.5(Na0.7K0.2Li0.1)0.5TiO3(BNKLT)和K0.5Na0.5NbO3(KNN)系列的Li0.04(Na0.5K0.5)096(Nb0.775Ta0.225)O3(KNNLT)无铅压电陶瓷薄膜,并利用X射线衍射仪(XRD)、扫描电镜(SEM)和原子力显微镜(AFM)对薄膜的晶体结构及表面形貌进行了比较研究。研究结果表明:薄膜的衬底温度、沉积室的氧气压力和薄膜的热处理温度对BNT和KNN薄膜结构和形貌都有较大影响,且影响程度不同;在最佳制备工艺参数下,利用PLD制备的BNT和KNN无铅压电陶瓷薄膜都具有精细的表面结构。
New types of lead-free piezoelectric ceramic thin films, Bio.5 (Na0.7 K0.2 Li0. 1 )0.5 TiO3 (BNKLT), which is one of Bi0.5 Na0.5TiO3 (BNT) series materials, and Lio.o4 (Na0.5K0.5)0.96 (Nb0.775 Ta0.225)O3 (KNNLT), which is one of K0.5Na0.5NbO3 (KNN) series materials, have been prepared on Pt/Ti/SiO/Si substrates by pulsed laser deposition (PLD) technique. The crystal structure and surface morphology of the films have been studied comparatively with X-ray diffraction ( XRD), scanning electron microscopy (SEM), and atomic force microscopy (AFM). The results showed that the properties of the Bio. 5 ( Na0.7 K0.2 Li0.1 ) 0. 5 TiO3 and Li0. 04 ( Na0. 5 K0. 5 ) 0. 96 ( Nb0. 775 Ta0. 225 )O3 films deposited are strongly dependent on the substrate temperature, the oxygen pressure in the deposition chamber, and the annealing temperature. With the optimized parameters for the growth of better textured film, the deposited Bio.5 ( Na0.7K0.2Li0.1) 0.5TiO3 and Li0.04 ( Na0. 5K0.5 ) 0.96 ( Nb0.775Ta0.225 )O3 films by PLD in present work are fine, uniform and dense.