Surface reconstructions and reflection high-energy electron diffraction intensity oscillations during homoepitaxial growth on nonmisoriented GaAs(111)B by MBE
- ISSN号:1674-4926
- 期刊名称:《半导体学报:英文版》
- 时间:0
- 分类:TN304.054[电子电信—物理电子学] TP391.41[自动化与计算机技术—计算机应用技术;自动化与计算机技术—计算机科学与技术]
- 作者机构:[1]School of lnformation Engineering, Hebei University of Technology, Tianjin 300130, China, [2]The 13th Electronic Research Institute, CETC, Shijiazhuang 050051, China
- 相关基金:Project supported by the National Natural Science Foundation of China (No. 61076004) and the Natural Science Foundation of Hebei Province, China (No. E2009000050).
中文摘要:
Corresponding author. Email: yangrx@hebut.edu.cn