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A compact model for single material double work function gate MOSFET
  • 期刊名称:Journal of Semiconductors
  • 时间:2013
  • 页码:1-5
  • 分类:TN386.1[电子电信—物理电子学] TS14-09[轻工技术与工程—纺织材料与纺织品设计;轻工技术与工程—纺织科学与工程]
  • 作者机构:[1]School of Electronics and Information Engineering, Anhui University, Hefei, China, [2]Key Laboratory of Intelligent Building of Anhui Province, Anhui University of Architecture, Hefei, China
  • 相关基金:Project supported by the National Youth Science Foundation of China (No. 61006064) and the Natural Science lounclatlon of t:Oucatlon Office, Anhui Province (No. KJ2013A071).
  • 相关项目:纳米CMOS器件统一模型模拟理论及性能优化方案的研究
中文摘要:

An analytical surface potential model for the single material double work function gate(SMDWG) MOSFET is developed based on the exact resultant solution of the two-dimensional Poisson equation. The model includes the effects of drain biases, gate oxide thickness, different combinations of S-gate and D-gate length and values of substrate doping concentration. More attention has been paid to seeking to explain the attributes of the SMDWG MOSFET, such as suppressing drain-induced barrier lowering(DIBL), accelerating carrier drift velocity and device speed. The model is verified by comparison to the simulated results using the device simulator MEDICI. The accuracy of the results obtained using our analytical model is verified using numerical simulations. The model not only offers the physical insight into device physics but also provides the basic designing guideline for the device.

英文摘要:

An analytical surface potential model for the single material double work function gate (SMDWG) MOSFET is developed based on the exact resultant solution of the two-dimensional Poisson equation. The model includes the effects of drain biases, gate oxide thickness, different combinations of S-gate and D-gate length and values of substrate doping concentration. More attention has been paid to seeking to explain the attributes of the SMDWG MOSFET, such as suppressing drain-induced barrier lowering (DIBL), accelerating carrier drift velocity and device speed. The model is verified by comparison to the simulated results using the device simulator MEDICI. The accuracy of the results obtained using our analytical model is verified using numerical simulations. The model not only offers the physical insight into device physics but also provides the basic designing guideline for the device.

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