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Calculated cross sections for the single ionization of atoms （N, Cu, As, Se, Sn, Sb, Te, I, Pb）by electron impact
  • ISSN号：1674-1056
  • 期刊名称：《中国物理B：英文版》
  • 时间：0
  • 分类：O56[理学—原子与分子物理;理学—物理]
  • 作者机构：[1]Institute of Atomic and Molecular Physics, Sichuan University, Chengdu 610065, China, [2]Changehun Institute of Applied Chemistry, Chinese Academy of Science, Changchun 130022, China
  • 相关基金：Project supported by the National Natural Science Foundation of China （Grant No 10676025）.
作者： 侯育君[1], 程新路[1], 陈恒杰[2]
关键词： 电子碰撞, 电子对测量值, K壳层电离截面, 原子物理学, DM formula, ionization cross sections, electron-impact
中文摘要：

Corresponding author. E-mail： chengxl@scu.edu.cn

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期刊信息
  • 《中国物理B：英文版》
  • 中国科技核心期刊
  • 主管单位:中国科学院
  • 主办单位:中国物理学会和中国科学院物理研究所
  • 主编：欧阳钟灿
  • 地址：北京 中关村 中国科学院物理研究所内
  • 邮编：100080
  • 邮箱：
  • 电话：010-82649026 82649519
  • 国际标准刊号：ISSN：1674-1056
  • 国内统一刊号：ISSN：11-5639/O4
  • 邮发代号:
  • 获奖情况:
  • 国内外数据库收录:
  • 被引量:406