中文摘要：

随着集成电路特征尺寸不断缩小,软错误已经成为影响电路可靠性的关键因素.计算软错误影响下逻辑电路的信号概率能辅助评估电路的可靠性.引起逻辑电路信号概率计算复杂性的原因是电路中的扇出重汇聚结构,本文提出一种计算软错误影响下逻辑电路可靠度的方法,使用概率公式和多项式运算,对引发相关性问题的扇出源节点变量作降阶处理,再利用计算得到的输出信号概率评估电路可靠度.用LGSynth91基准电路、74系列电路和ISCAS85基准电路为对象进行实验,结果表明所提方法准确有效.

英文摘要：

As the feature size of integrated circuits shrinks, soft errors become the key factor influencing circuit reliability. Calculation of signal probability of logic circuits affected by soft errors can assist us in evaluating the circuit reliability. The recon- vergent fanouts in circuits increase computational complexity of signal probability. A reliability calculation method of logic circuits is proposed in this paper. The method uses the probability formula and polynomial arithmetic, then the fanout source variables which trigger signal correlation are reduced.Based on this,the circuit reliability can be evaluated by the output signal probability. Experi- mental results on LGSynth91,74X series and ISCAS85 benchmark circuits show that our method is accurate and efficient.