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Substrate-induced stress in silicon nanocrystal/SiO2 multilayer structures
  • ISSN号:1674-1056
  • 期刊名称:Chinese Physics B
  • 时间:2012.7
  • 页码:-
  • 分类:TN304.12[电子电信—物理电子学] TB383[一般工业技术—材料科学与工程]
  • 作者机构:[1]National Laboratory of Solid State Microstructures, School of Physics, and School of Electronic Science and Engineering, Nanjing University, Nanjing 210093, China
  • 相关基金:Project supported by the National Basic Research Program of China (Grant No. 2013CB632101), the National Natural Science Foundation of China (Grant Nos. 11274155 and 61036001), and Priority Academic Program Development of Jiangsu Higher Education Institutions, Jiangsu Province, China,
  • 相关项目:运用量子尺寸效应和杂质中间带提高硅基太阳电池效率的研究
中文摘要:

Nanocrystalline Ge(nc-Ge) single layers and nc-Ge/SiN x multilayers are prepared by laser annealing amorphous Ge(a-Ge) films and a-Ge/SiN x multilayers.The microstructures as well as the electrical properties of laser-crystallized samples are systematically studied by using various techniques.It is found that the optical band gap of nc-Ge film is reduced compared with its amorphous counterpart.The formed nc-Ge film is of p-type,and the dark conductivity is enhanced by6 orders for an nc-Ge single layer and 4 orders for a multilayer.It is suggested that the carrier transport mechanism is dominant by the thermally activation process via the nanocrystal,which is different from the thermally annealed nc-Ge sample at an intermediate temperature.The carrier mobility of nc-Ge film can reach as high as about 39.4 cm2·V-1·s-1,which indicates their potential applications in future nano-devices.

英文摘要:

Nanocrystalline Ge (nc-Ge) single layers and nc-Ge/SiNx multilayers are prepared by laser annealing amorphous Ge (a-Ge) films and a-Ge/SiNx multilayers. The microstructures as well as the electrical properties of laser-crystallized samples are systematically studied by using various techniques. It is found that the optical band gap of nc-Ge film is reduced compared with its amorphous counterpart. The formed nc-Ge film is of p-type, and the dark conductivity is enhanced by 6 orders for an nc-Ge single layer and 4 orders for a multilayer. It is suggested that the carrier transport mechanism is dominant by the thermally activation process via the nanocrystal, which is different from the thermally annealed nc-Ge sample at an intermediate temperature. The carrier mobility of nc-Ge film can reach as high as about 39.4 cm2.V ^-1 .s^-1, which indicates their potential applications in future nano-devices.

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期刊信息
  • 《中国物理B:英文版》
  • 中国科技核心期刊
  • 主管单位:中国科学院
  • 主办单位:中国物理学会和中国科学院物理研究所
  • 主编:欧阳钟灿
  • 地址:北京 中关村 中国科学院物理研究所内
  • 邮编:100080
  • 邮箱:
  • 电话:010-82649026 82649519
  • 国际标准刊号:ISSN:1674-1056
  • 国内统一刊号:ISSN:11-5639/O4
  • 邮发代号:
  • 获奖情况:
  • 国内外数据库收录:
  • 被引量:406