中文摘要：

针对目前电连接器的贮存寿命评估中尚未明确计入插拔的效应,因而不能准确地指导实际应用的现状,以Y11P-1419型电连接器为研究对象,深入分析了电连接器贮存期间的氧化腐蚀和定期的测试插拔所造成的接触失效,并设计了实验室模拟实际贮存的加速退化对照试验,进而通过对试验现象的观察、试验数据的统计分析和试验样品插孔微观表面形貌的扫描电镜（SEM）与能谱（EDS）分析等方面的研究,明确了贮存电连接器计入插拔的效应：因定期插拔造成了插拔后的阻值跳变,且因插拔而逐渐刮擦磨损镀金层和氧化膜、裸露基体铜,加速了后续贮存期间接触区域的氧化腐蚀。研究结果表明,插拔明显地加快了贮存电连接器性能退化的进程。因此,为了提高电连接器贮存寿命评估的准确度,必须计入插拔因素的影响。

英文摘要：

Aiming at figuring out the effects of insertion-extraction on storage life evaluation of electrical connector, and accurately guiding the practice, the Y1 IP-1419 electrical connector was taken as the object. The contact failure, which was caused by oxidation corrosion and insertion-extraction, was analyzed. Moreover, the accelerated degradation test was designed. The observation of test phenomena, the statisti- cal analysis of data, and the micro morphology analysis of receptacle by SEM and EDS, were researched. And the effects of insertion-extrac- tion during storage were revealed ： regular insertion-extraction caused jump of resistance, were of gold layer and oxide film, exposed of copper substrate, it can accelerate of oxide etched for the contact area. The research results show that insertion-extraction can accelerate the per- formance degradation for the storage electrical connector, improving the accuracy of the storage life evaluation, the effects of insertion-extrac- tion must be considered.